VISIBLE AND NEAR-INFRARED LEAF REFLECTANCE SPECTRA, 1992-1993 (ACCP)Entry ID: ACCP_LEAFSPEC
Abstract: The leaf spectra datasets contain visible and near infrared reflectance spectra data for both fresh and dry leaf samples collected in the ACCP. These samples are from Blackhawk Island, WI, Harvard Forest, MA, Howland, ME, Jasper Ridge, CA field sites and the Douglas fir and bigleaf maple seedling canopy study sites. Data reported for each sample is absorbance [log(1/Reflectance)] from 400-2498nm ... at 2nm intervals and a resolution of 10nm. These data were collected for the purpose of determining the relationship of foliar chemical concentrations with visible and near infrared wavelength reflectance spectra.. Both multiple linear regression and partial least square regression techniques have been used to relate lab chemistry data to spectral reflectance. ORNL DAAC maintains information on the entire ACCP.
Data Set Citation
Dataset Originator/Creator: ABER, J.D.MARTIN, M.E.
Dataset Title: VISIBLE AND NEAR-INFRARED LEAF REFLECTANCE SPECTRA, 1992-1993 (ACCP)
Dataset Release Date: 1999
Dataset Release Place: Oak Ridge, Tennessee, U.S.A.
Dataset Publisher: Oak Ridge National Laboratory Distributed Active Archive Center
Data Presentation Form: Online Files
Dataset DOI: doi:10.3334/ORNLDAAC/424Online Resource: http://mercury.ornl.gov/ornldaac/send/query?term2=424&term2attribut...
Start Date: 1992-06-18Stop Date: 1993-05-27
ISO Topic Category
Data Set Progress
Role: TECHNICAL CONTACT
Email: John.Aber at unh.edu
University of New Hampshire Complex Systems Research Center
Province or State: NH
Postal Code: 03824
Role: DIF AUTHOR
Phone: (865) 574-7447
Email: uso at daac.ornl.gov
ORNL DAAC User Services Office Oak Ridge National Laboratory
City: Oak Ridge
Province or State: TN
Postal Code: 37831-6407
Extended Metadata Properties
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Creation and Review Dates
DIF Creation Date: 1999-05-07
Last DIF Revision Date: 2011-11-01